MAGNETIC FORCE MICROSCOPY ANALYSIS OF SOFT THIN-FILM ELEMENTS

Citation
W. Rave et al., MAGNETIC FORCE MICROSCOPY ANALYSIS OF SOFT THIN-FILM ELEMENTS, IEEE transactions on magnetics, 30(6), 1994, pp. 4473-4478
Citations number
20
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
00189464
Volume
30
Issue
6
Year of publication
1994
Part
1
Pages
4473 - 4478
Database
ISI
SICI code
0018-9464(1994)30:6<4473:MFMAOS>2.0.ZU;2-F
Abstract
Several different soft magnetic materials have been investigated by me ans of Magnetic Force Microscopy (MFM) using a commercial Atomic Force Microscope (Nanoscope III) with slope detection. The observed contras t of basically solenoidal magnetization distributions in nanocrystalli ne Fe-Permalloy multilayer and single-layer Permalloy thin film elemen ts not only reveals wall locations, and thus the subdivision of the ma gnetic volume into domains, but also a decomposition into subdomains h itherto undocumented. A strong influence of the magnetic fine structur e is also demonstrated Additional observations of the classical lancet s of a Goss texture in bulk Iron confirm the fact that the symmetries of the observed contrast are consistent with those of the perpendicula r component of magnetization within a volume close to the sample surfa ce.