ATOMIC FORCE MICROSCOPY EXAMINATION OF THE TOPOGRAPHY OF A HYDRATED BACTERIAL BIOFILM ON A COPPER SURFACE

Citation
Pj. Bremer et al., ATOMIC FORCE MICROSCOPY EXAMINATION OF THE TOPOGRAPHY OF A HYDRATED BACTERIAL BIOFILM ON A COPPER SURFACE, Current microbiology, 24(4), 1992, pp. 223-230
Citations number
18
Journal title
ISSN journal
03438651
Volume
24
Issue
4
Year of publication
1992
Pages
223 - 230
Database
ISI
SICI code
0343-8651(1992)24:4<223:AFMEOT>2.0.ZU;2-W
Abstract
A bacterium, designated CCI#8, that was isolated from a corroded coppe r coupon colonized both polished and unpolished copper surfaces under batch culture conditions. Atomic Force Microscopy (AFM) images reveale d that the biofilm was heterogeneous in nature, both in depth and in c ell distribution. Bacterial cells were shown to be associated with pit s on the surface of the unpolished copper coupons. These observations support previous studies that CCI#8 is associated with the pitting cor rosion of copper.