Using a chlorination reaction of copper, the possibility of the applic
ation of the electron energy loss fine structure (EELFS) technique for
the determination of the local structure of the formed chloride film
was shown. The intense extended fine structure above the Cl L2,3-edge
detected in thin CuCl films permitted to obtain the nearest neighbors
distance Cl-Cu which was equal to 2.32 +/- 0.03 angstrom. This value i
s in good agreement with the corresponding one for bulk CuCl.