A TANDEM SIMS STUDY OF POLY(VINYL METHYL-ETHER)

Results are presented for a tandem-SIMS investigation of the fragmenta tion patterns of secondary ions sputtered from the surface of poly(vin yl methyl ether) (PVME). A complete fragmentation sequence is deduced which is capable of explaining the formation of most of the major ions observed in the SIMS spectrum in terms of fragmentation steps proceed ing from the largest secondary ion observed. The fragmentation steps i nvolved in the formation of these ions are discussed and the secondary ion structures are identified.