Ss. Lu et Cc. Huang, HIGH-CURRENT-GAIN GA-0.51IN-0.49P GAAS HETEROJUNCTION BIPOLAR-TRANSISTOR GROWN BY GAS-SOURCE MOLECULAR-BEAM EPITAXY/, IEEE electron device letters, 13(4), 1992, pp. 214-216
A Ga0.51In0.49P/GaAs heterojunction bipolar transistor (HBT) grown on
a (100) substrate by gas-source molecular beam epitaxy (GSMBE) was fab
ricated. A common-emitter dc current gain exceeding 1580 (differential
gain > 2100) and an offset voltage as small as 120 mV were achieved.
The results demonstrate that high current gain and small offset voltag
e could be maintained without the need of grading the emitter/base jun
ction in the Ga0.51In0.49P/GaAs system because of its larger valence-b
and discontinuity than conduction-band discontinuity. To our knowledge
, the electrical current gain achieved was the highest value ever repo
rted in Ga0.51In0.49P/GaAs system HBT's.