HIGH-CURRENT-GAIN GA-0.51IN-0.49P GAAS HETEROJUNCTION BIPOLAR-TRANSISTOR GROWN BY GAS-SOURCE MOLECULAR-BEAM EPITAXY/

Authors
Citation
Ss. Lu et Cc. Huang, HIGH-CURRENT-GAIN GA-0.51IN-0.49P GAAS HETEROJUNCTION BIPOLAR-TRANSISTOR GROWN BY GAS-SOURCE MOLECULAR-BEAM EPITAXY/, IEEE electron device letters, 13(4), 1992, pp. 214-216
Citations number
15
ISSN journal
07413106
Volume
13
Issue
4
Year of publication
1992
Pages
214 - 216
Database
ISI
SICI code
0741-3106(1992)13:4<214:HGGHB>2.0.ZU;2-T
Abstract
A Ga0.51In0.49P/GaAs heterojunction bipolar transistor (HBT) grown on a (100) substrate by gas-source molecular beam epitaxy (GSMBE) was fab ricated. A common-emitter dc current gain exceeding 1580 (differential gain > 2100) and an offset voltage as small as 120 mV were achieved. The results demonstrate that high current gain and small offset voltag e could be maintained without the need of grading the emitter/base jun ction in the Ga0.51In0.49P/GaAs system because of its larger valence-b and discontinuity than conduction-band discontinuity. To our knowledge , the electrical current gain achieved was the highest value ever repo rted in Ga0.51In0.49P/GaAs system HBT's.