INTERPRETATION OF INTERFACE PROFILES IN S ECONDARY-ION MASS-SPECTROMETRY (SIMS) OF METALLIC MULTILAYERS

Authors
NEMRAOUI O MILOCHE M KAABOUCHI M SELLA C
Citation
O. Nemraoui et al., INTERPRETATION OF INTERFACE PROFILES IN S ECONDARY-ION MASS-SPECTROMETRY (SIMS) OF METALLIC MULTILAYERS, Journal de physique. IV, 6(C7), 1996, pp. 31-36
Citations number
9
Categorie Soggetti
Physics
Journal title
Journal de physique. IV → ACNP
ISSN journal
11554339
Volume
6
Issue
C7
Year of publication
1996
Pages
31 - 36
Database
ISI
SICI code
1155-4339(1996)6:C7<31:IOIPIS>2.0.ZU;2-Q