R.f. sputtered Fe/CoNbZr multilayers are studied by means of conversio
n electron Mossbauer spectroscopy (CEMS) and X-ray diffraction (XRD).
In the as-deposited conditions, an interdiffusion layer thickness of a
bout 1.3 mn can be calculated from the GEMS data Subsequently the samp
les were annealed in vacuum for 2h at 570 K. It is then estimated the
percentage of interfacial Fe alloy formed,the structure of which is ve
ry likely nanocrystalline.