TRANSIENT-GRATING EXPERIMENTS FOR THE STUDY OF ELECTRON-HOLE SEPARATION IN AN ELECTRIC-FIELD

Authors
FELDMANN J GROSSMANN P STOLZ W GOBEL E PLOOG K
Citation
J. Feldmann et al., TRANSIENT-GRATING EXPERIMENTS FOR THE STUDY OF ELECTRON-HOLE SEPARATION IN AN ELECTRIC-FIELD, Semiconductor science and technology, 7(3B), 1992, pp. 130-132
Citations number
6
Journal title
Semiconductor science and technology → ACNP
ISSN journal
02681242
Volume
7
Issue
3B
Year of publication
1992
Pages
130 - 132
Database
ISI
SICI code
0268-1242(1992)7:3B<130:TEFTSO>2.0.ZU;2-B
Abstract
We demonstrate that a transient-grating experiment is a sensitive opti cal method to study the dynamics of the spatial separation of electron s and holes in an electric field, i.e. the screening of the electric f ield by charge rearrangement. It provides high temporal as well as spa tial resolution. The technique is applied to study the field-induced c arrier dynamics in the plane of an intrinsic GaAs/AlAs quantum well la yer.