A. Mourchid et al., HOT CARRIER RELAXATION AND RECOMBINATION IN AMORPHOUS-SEMICONDUCTORS, Semiconductor science and technology, 7(3B), 1992, pp. 302-304
We report the results of femtosecond optical measurements following in
jection of a very large density (> 10(19) cm-3) of carriers with 100 f
s 2 eV pulses in a-Si:H. We measure the momentum scattering time of th
e free carriers (< 1 fs), the thermalization rate of hot carriers (gre
ater-than-or-similar-to 1 eV ps-1), the non-radiative carrier recombin
ation lifetime (1-10 ps), and the decay time of optic phonons into aco
ustic phonons (less-than-or-similar-to 100 fs). The lack of momentum c
onservation in amorphous materials is responsible for the much shorter
characteristic times in a-Si:H than in a typical direct-gap semicondu
ctor such as GaAs.