DYNAMIC STUDY OF SECONDARY RECRYSTALLIZATION OF 3-PERCENT SI-FE BY SYNCHROTRON X-RADIATION TOPOGRAPHY

Authors
USHIGAMI Y SUGA Y TAKAHASHI N KAWASAKI K CHIKAURA Y KII H
Citation
Y. Ushigami et al., DYNAMIC STUDY OF SECONDARY RECRYSTALLIZATION OF 3-PERCENT SI-FE BY SYNCHROTRON X-RADIATION TOPOGRAPHY, Journal of materials engineering, 13(2), 1991, pp. 113-118
Citations number
20
Journal title
Journal of materials engineering → ACNP
ISSN journal
09317058
Volume
13
Issue
2
Year of publication
1991
Pages
113 - 118
Database
ISI
SICI code
0931-7058(1991)13:2<113:DSOSRO>2.0.ZU;2-#