A NOVEL TECHNIQUE FOR THE MEASUREMENT OF GENERATION LIFETIME IN UNDOPED POLYSILICON MATERIAL USING THE PRINCIPLE OF CHARGE CENTROIDS

Authors
MCDAID LJ HALL S ECCLESTON W
Citation
Lj. Mcdaid et al., A NOVEL TECHNIQUE FOR THE MEASUREMENT OF GENERATION LIFETIME IN UNDOPED POLYSILICON MATERIAL USING THE PRINCIPLE OF CHARGE CENTROIDS, Semiconductor science and technology, 6(10), 1991, pp. 1032-1035
Citations number
6
Journal title
Semiconductor science and technology → ACNP
ISSN journal
02681242
Volume
6
Issue
10
Year of publication
1991
Pages
1032 - 1035
Database
ISI
SICI code
0268-1242(1991)6:10<1032:ANTFTM>2.0.ZU;2-7