POINT-DEFECTS AND DIFFUSION IN SEMICONDUCTORS

Authors
Citation
Um. Gosele et Ty. Tan, POINT-DEFECTS AND DIFFUSION IN SEMICONDUCTORS, MRS bulletin, 16(11), 1991, pp. 42-46
Citations number
23
Journal title
ISSN journal
08837694
Volume
16
Issue
11
Year of publication
1991
Pages
42 - 46
Database
ISI
SICI code
0883-7694(1991)16:11<42:PADIS>2.0.ZU;2-G