PULSE-WIDTH INFLUENCE ON LASER STRUCTURING OF DIELECTRICS

Authors
ASHKENASI D VAREL H ROSENFELD A NOACK F CAMPBELL EEB
Citation
D. Ashkenasi et al., PULSE-WIDTH INFLUENCE ON LASER STRUCTURING OF DIELECTRICS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 122(3), 1997, pp. 359-363
Citations number
14
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
Journal title
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms → ACNP
ISSN journal
0168583X
Volume
122
Issue
3
Year of publication
1997
Pages
359 - 363
Database
ISI
SICI code
0168-583X(1997)122:3<359:PIOLSO>2.0.ZU;2-2
Abstract
The morphology of several dielectrics (a-SiO2, CaF2 and BaF2) irradiat ed by laser light at a wavelength of 790 nm for different pulse widths (between 200 fs and 5 ps) and fluences near the single shot damage th reshold has been investigated by using the complementary techniques of electron microscopy and atomic force microscopy, Differences can be o bserved which we relate to the mechanisms and dynamics of defect produ ction in these wide band gap materials.