In the present work we have studied the most important parameters whic
h can influence the radiation induced diffusion mechanism of Xe ions i
mplanted into photoresist films. With this aim we have Ar post-bombard
ed the Xe implanted samples at a fixed Ar ion energy, covering a wide
range of fluences. In addition the implantation fluences as well as th
e ion species used in the bombardment were changed. The results show t
hat the radiation induced diffusion process undergoes a trapping-detra
pping mechanism. The trapping probability is proportional to the impla
nted fluence, and the detrapping one depends on the kind of ion used i
n the bombarding experiment. Finally it is shown that the nuclear ener
gy transfer plays an important role in the radiation induced diffusion
mechanism.