The surfaces of c-axis oriented YBa2Cu3O7-delta (YBCO) thin films prep
ared by DC-magnetron sputtering on SrTiO3 (100) substrates were studie
d by means of X-ray photoelectron spectroscopy (XPS). The measurements
were carried out subsequently during a period of a three-months-stora
ge of the samples in ambient air as well as immediately after the film
deposition without exposing the film surfaces to atmosphere. A chemic
al reaction with formation of hydroxides and carbonates on top of the
film surface was observed in the case of the air-exposed samples. The
thickness of this top layer was found to develop proportionally to the
square root of time with a time constant of 0.1 nm/h0.5. Accompanying
measurements of the critical temperature (T(c)) and the critical curr
ent density (j(c)) show that T(c) and j(c) of the films are normally n
ot affected by the top layer formation and remain nearly unchanged ove
r periods longer than eight months.