ELECTRONIC RELAXATION INDUCED BY INTERACTION BETWEEN DIATOMICS IN LOW-TEMPERATURE MATRICES

Citation
M. Chergui et al., ELECTRONIC RELAXATION INDUCED BY INTERACTION BETWEEN DIATOMICS IN LOW-TEMPERATURE MATRICES, The Journal of chemical physics, 98(8), 1993, pp. 6176-6182
Citations number
22
ISSN journal
00219606
Volume
98
Issue
8
Year of publication
1993
Pages
6176 - 6182
Database
ISI
SICI code
0021-9606(1993)98:8<6176:ERIBIB>2.0.ZU;2-2
Abstract
Fluorescence (phosphorescence) excitation spectra as we as luminescenc e spectra and decay times were investigated for NO in N2 and mixed N2/ Kr matrices. All Rydberg states rapidly relax to the ground state in m ixed matrices with the N2 Molar fraction exceeding x(N2) = 0.35. This dependence on the N2 concentration is attributed to the complete fluor escence quenching of all NO molecules with at least one N2 nearest nei ghbor. The vibrational levels of the B 2PI valence states strongly cou pled to the Rydberg state are also depopulated. The general picture of relaxation channels is discussed.