CYCLIC-OXIDATION BEHAVIOR OF TIAL AND OF TIAL ALLOYS

Citation
S. Becker et al., CYCLIC-OXIDATION BEHAVIOR OF TIAL AND OF TIAL ALLOYS, Oxidation of metals, 39(1-2), 1993, pp. 93-106
Citations number
9
Journal title
ISSN journal
0030770X
Volume
39
Issue
1-2
Year of publication
1993
Pages
93 - 106
Database
ISI
SICI code
0030-770X(1993)39:1-2<93:CBOTAO>2.0.ZU;2-N
Abstract
The cyclic-oxidation behavior of (in w/o) Ti-36Al, Ti-35Al-0.1C, Ti-35 Al-1.4V-0.1C and Ti-35Al-5Nb-0.1C was studied between 800 and 1000-deg rees-C in air. A few experiments were also performed in oxygen. Scale spallation after oxidation in air occurs during cooling on TiAl, TiAl- C, and TiAl-V at or close to the metal/scale interface when a critical scale thickness has been achieved This process repeats and can lead t o a stratified scale. These three materials form scales composed of an inward-growing fine-grain mixture of TiO2-Al2O3 and an outward-growin g coarse-grain TiO2 layer or TiO2 + Al2O3 mixture. The TiAl-Nb alloy h ad a significantly different behavior. The scale on this material grew very slowly because a protective Al2O3 layer formed at the metal/scal e interface. This behavior resulted in much better resistance to spall ation because the critical scale thickness was reached only after a mu ch longer time, and is different from the behavior of the other three alloys. Oxidation in air leads to slight nitridation of the subsurface zone beneath the scale. In comparison to oxidation in air, oxidation in oxygen improves the cyclic-oxidation behavior. Whereas the scale fo rmed in air was uniformly thick over the entire surface, the scale gro wn in oxygen varied locally in structure and thickness. A large fracti on of the surface was covered with a thin Al2O3 layer, while the remai ning part formed a two-layer scale similar to that formed in air. The results are discussed briefly in the light of a recently published mod el for scale spallation under compressive stress, however, quantitativ e estimations are not possible due to a lack of relevant data.