J. Hoffmann et al., BIAXIALLY TEXTURED YTTRIA-STABILIZED ZIRCONIA BUFFER LAYERS ON ROTATING CYLINDRICAL SURFACES, Journal of materials research, 12(3), 1997, pp. 593-595
Biaxially textured yttria stabilized zirconia (YSZ) buffer layers are
prepared on rotating cylindrical surfaces by an ion-beam-assisted depo
sition (IBAD) process. A large fraction of the cylinder surface can be
coated at the same time, resulting in an effective deposition rate of
40 nm/h for the whole tube circumference (diameter of the tube 12 mm)
. The in-plane alignment depends on the total film thickness and the r
otation velocity. The best in-plane textures achieved so far with a fu
ll width half maximum (FWHM) value of 27 degrees are sufficient for th
e preparation of YBaCuO films with critical current densities above 10
(5) A cm(-2) at 77 K and self-fields.