BIAXIALLY TEXTURED YTTRIA-STABILIZED ZIRCONIA BUFFER LAYERS ON ROTATING CYLINDRICAL SURFACES

Citation
J. Hoffmann et al., BIAXIALLY TEXTURED YTTRIA-STABILIZED ZIRCONIA BUFFER LAYERS ON ROTATING CYLINDRICAL SURFACES, Journal of materials research, 12(3), 1997, pp. 593-595
Citations number
8
Categorie Soggetti
Material Science
ISSN journal
08842914
Volume
12
Issue
3
Year of publication
1997
Pages
593 - 595
Database
ISI
SICI code
0884-2914(1997)12:3<593:BTYZBL>2.0.ZU;2-V
Abstract
Biaxially textured yttria stabilized zirconia (YSZ) buffer layers are prepared on rotating cylindrical surfaces by an ion-beam-assisted depo sition (IBAD) process. A large fraction of the cylinder surface can be coated at the same time, resulting in an effective deposition rate of 40 nm/h for the whole tube circumference (diameter of the tube 12 mm) . The in-plane alignment depends on the total film thickness and the r otation velocity. The best in-plane textures achieved so far with a fu ll width half maximum (FWHM) value of 27 degrees are sufficient for th e preparation of YBaCuO films with critical current densities above 10 (5) A cm(-2) at 77 K and self-fields.