QUANTITATIVE LATTICE MEASUREMENT OF THIN LANGMUIR-BLODGETT-FILMS BY ATOMIC-FORCE MICROSCOPY

Citation
Dk. Schwartz et al., QUANTITATIVE LATTICE MEASUREMENT OF THIN LANGMUIR-BLODGETT-FILMS BY ATOMIC-FORCE MICROSCOPY, Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics, 47(1), 1993, pp. 452-460
Citations number
40
ISSN journal
1063651X
Volume
47
Issue
1
Year of publication
1993
Pages
452 - 460
Database
ISI
SICI code
1063-651X(1993)47:1<452:QLMOTL>2.0.ZU;2-Z
Abstract
We have quantitatively determined the nature of the surface order of t he outermost layer of monolayer and multilayer Langmuir-Blodgett films of cadmium arachidate, in air and under water, using atomic-force mic roscopy. Molecular-resolution images of 1200-nm2 areas show that the a lkyl chains of 2-5-layer films have a noncentered rectangular lattice with lattice constants of 0.482+/-0.004 and 0.748+/-0.006 nm, in good agreement with diffraction measurements of bulk aliphatic systems. We show unambiguously that the unit cell consists of two molecules. In co ntrast with the highly ordered multilayers, monolayer films have a dis ordered surface. Images taken under water of the head-group surface sh ow that the bilayer surface is disordered, while thicker films show or der of the alkyl chains. The presence of an underlying head-group-head -group interface with its associated cadmium ion bridging is shown to be the critical feature needed to obtain a stable and ordered surface layer.