ELECTRONIC-STRUCTURE OF THE CHANNEL COMPOUND TLCR5SE8 - AN XPS STUDY

Authors
BENSCH W WORNER E HUG P
Citation
W. Bensch et al., ELECTRONIC-STRUCTURE OF THE CHANNEL COMPOUND TLCR5SE8 - AN XPS STUDY, Solid state communications, 86(3), 1993, pp. 165-169
Citations number
39
Categorie Soggetti
Physics, Condensed Matter
Journal title
Solid state communications → ACNP
ISSN journal
00381098
Volume
86
Issue
3
Year of publication
1993
Pages
165 - 169
Database
ISI
SICI code
0038-1098(1993)86:3<165:EOTCCT>2.0.ZU;2-H
Abstract
The channel compound TlCr5Se8 crystallizes with the TlV5S8 structure. X-ray Photoelectron Spectroscopy (XPS) reveals that the title compound is a poor metal or semimetal with a low density of states at E(F). Th e valence band is composed of strongly hybridized Se 4p, Cr 3a and Tl 6s and 6 p states. The Tl atom as well as the Cr atoms carry a low for mal positive charge and the bonding interactions in the Cr5Se8 host ma trix are highly covalent, whereas the interaction between Tl and Cr5Se 8 exhibits only a weak covalent character.