Na. Krymskaya et al., ANALYSIS OF FIBEROPTIC LEAD-SILICATE GLASSES BY NUCLEAR-PHYSICS METHODS, Soviet journal of optical technology, 59(11), 1992, pp. 658-663
An elemental analysis of the near-surface layers of original and reduc
ed lead-silicate glasses is performed by means of nondestructive testi
ng methods using accelerated charged particles. The concentration prof
iles of hydrogen (to a depth of 0.4 mum) and lead (to a depth of 3.5 m
um) are measured in 15 pairs of samples of different melts. Based on t
he resulting data, conclusions are reached with regard to the concentr
ation profile of lead, reduced in the thermohydrogen treatment process
to a depth of 0.4 mum. These results show how the quantities that cha
racterize the surface composition of the samples and the volume of the
glass depend on the original amount of hydrogen within the glass upon
completion of the melt.