We show here for the first time that the width of implant damage disor
dered regions in GaAs-AlGaAs MQWs can be extended to depths as far as
approximately 30 times the implant projected range (R(p)). This is acc
omplished by performing room-temperature implants of isoelectronic Sb (R(p) approximately 0.09 mum) in thick 130 period multiquantum well s
tructures consisting of alternate layers of approximately 100 angstrom
GaAs (L(z)) and approximately 100 angstrom Al0.3Ga0.7As (L(b)). Subse
quent to high temperature (850-degrees-C) and long duration (up to 4 h
) furnace anneals, the disordering has been monitored using photolumin
escence spectroscopy and secondary ion mass spectroscopy for depth dep
endence. The data is tentatively explained assuming a long range migra
tion of defects both during implantation and annealing processes.