EPITAXY ENHANCEMENT OF BETA-FESI2 GROWN BY ION-BEAM ASSISTED DEPOSITION

Citation
A. Terrasi et al., EPITAXY ENHANCEMENT OF BETA-FESI2 GROWN BY ION-BEAM ASSISTED DEPOSITION, Applied physics letters, 62(17), 1993, pp. 2102-2104
Citations number
11
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
62
Issue
17
Year of publication
1993
Pages
2102 - 2104
Database
ISI
SICI code
0003-6951(1993)62:17<2102:EEOBGB>2.0.ZU;2-B
Abstract
Iron silicide layers have been grown by 200 eV Ar+ beam assisted depos ition of Fe onto [001] Si single crystals maintained at high temperatu res. Polycrystalline FeSi has been formed at T=400-degrees-C while par tially epitaxial beta-FeSi2 was obtained after deposition at 500-degre es-C. Samples have been analyzed by Rutherford backscattering spectros copy and transmission electron microscopy. The main effects of the ion beam have been the reduction of the average grain size of the polycry stallites for both phases and the enhancement of the epitaxial fractio n for the beta-FeSi2 phase. The role of the ion beam during the format ion of the iron silicides has been discussed.