HIGH-RESOLUTION ION-INDUCED X-RAY SPECTROSCOPY FOR CHEMICAL-STATE ANALYSIS

Authors
Citation
F. Folkmann, HIGH-RESOLUTION ION-INDUCED X-RAY SPECTROSCOPY FOR CHEMICAL-STATE ANALYSIS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 75(1-4), 1993, pp. 9-13
Citations number
7
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
ISSN journal
0168583X
Volume
75
Issue
1-4
Year of publication
1993
Pages
9 - 13
Database
ISI
SICI code
0168-583X(1993)75:1-4<9:HIXSFC>2.0.ZU;2-F
Abstract
Satellite lines of K X-ray lines from K and Cr, and L lines from In ar e observed for impact by 1.4 MeV/u H-1+, He-4(2+), C-12(4+), O-16(4+) and Cl-35(8+). A curved crystal spectrometer was used with a position sensitive proportional counter with improved linearity of the backgamm on readout. The distribution of Cr K(alpha) satellite lines depends on the chemical state of Cr, being peaked at lower energy for the toxic valency 6 compounds than for valency 3 and metallically bound Cr. Fluo rescence excitation of the Cr diagram line is observed for a stainless steel sample from enhancement by Fe X-rays.