Y. Ito et al., STRUCTURAL EVALUATION OF A MO SI MULTILAYER, ANALYZED WITH VARIOUS WAVELENGTHS/, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 75(1-4), 1993, pp. 355-359
A Mo/Si multilayer is synthesized and its structure is evaluated on an
atomic scale using various soft X-rays (MgKalpha, FKalpha, OKalpha, a
nd CKalpha). Two types of models based on the optical and diffraction
methods were considered. It is found that the latter theory is more ef
fective in extracting the multilayer structure.