Ym. Galperin, DISORDER-INDUCED FLICKER NOISE IN HIGH-TC RF SUPERCONDUCTING QUANTUM MAGNETOMETERS, Journal of applied physics, 73(8), 1993, pp. 4054-4060
Low-frequency noise in a hysteric rf superconducting quantum interfere
nce device (SQUID) originating from fluctuations of critical current o
f a weak link is considered. Such noise can be due to trapping-detrapp
ing processes within the tunnel barrier or to the presence of structur
al defects with internal degrees of freedom in the surrounding of the
weak link. The defects can switch between two (or more) metastable sta
tes due to interaction with the thermal bath. On the other hand, elast
ic (and electric) fields created by defects act upon the critical curr
ent of the weak link inducing its fluctuations in time. Such noise is
most important for high-T(c) SQUIDs at high enough temperatures when d
efects are effectively interacting with the thermal bath. The dependen
cies of the intensity and statistics of flicker noise on the SQUID's p
arameters and operating regime are analyzed. It is shown that higher c
orrelation functions of output voltage at a given driving current can
provide some information on the mechanism of 1/f noise in rf SQUIDs.