IMAGING WITH ULTRA-RESOLUTION IN THE PRESENCE OF STRONG SCATTERING

When there is random scattering between a source and an imaging telesc ope or interferometer, it is known that the angular resolution that ca n be attained with a long exposure observation is below the ideal limi t. Techniques such as speckle and self-calibration permit the use of s hort exposure data to restore the full resolution of the instrument. W e show in this Letter that, under certain circumstances involving very strong scattering, short exposure data can actually be used to enhanc e the angular resolution to well beyond the ideal limit. Schematic des igns for an interferometer to make use of this effect are presented.