Atomic force scanning microscopy (AFM) was used to investigate the dis
persion of low molecular weight compounds in ethylene-propylene copoly
mers (EPM). Where other microscopical techniques failed to provide mor
phological details of this type of blend, as a result of the restricte
d resolution (light microscopy) or the volatility of the low molecular
weight component (SEM), the AFM technique provided surface images, wh
ich show inclusions in the matrix of the uncrosslinked polymers.