DEGRADATION MECHANISM OF AU ALOX/AL TUNNEL JUNCTION/

Authors
HIRAO Y HARAGUCHI M FUKUI M GUO GX YOSHIDA A
Citation
Y. Hirao et al., DEGRADATION MECHANISM OF AU ALOX/AL TUNNEL JUNCTION/, Journal of the Physical Society of Japan, 62(4), 1993, pp. 1286-1291
Citations number
9
Categorie Soggetti
Physics
Journal title
Journal of the Physical Society of Japan → ACNP
ISSN journal
00319015
Volume
62
Issue
4
Year of publication
1993
Pages
1286 - 1291
Database
ISI
SICI code
0031-9015(1993)62:4<1286:DMOAAT>2.0.ZU;2-U
Abstract
A life time of light emitting Au/AlO(x)/Al tunnel junction which has b een widely investigated is usually short at room temperature in the ai r. We have explored the origin of such a short life time of tunnel jun ction. It has been found that the degradation of tunnel junction is du e to an oxidation of Al film and a destruction of the junction.