MULTIPLE-BEAM TILT MICROSCOPY FOR SUPER RESOLVED IMAGING

In this paper we report a super-resolved reconstruction of a thin crys tal of H-Nb2O5 in which the limit of continuous transfer has been exte nded from about 0.2 nm in the conventional axial image to 0.13 nm. To allow the reconstruction of crystalline fragments containing little st able amorphous material, modifications to the standard procedure for i mage registration have been developed. Both the modulus and phase of t he reconstruction appear to contain directly interpretable information .