H. Fujimaki et al., HIGH-SPEED SUBHALF MICRON SATURN TRANSISTOR USING EPITAXIAL BASE TECHNOLOGY, IEICE transactions on electronics, E76C(4), 1993, pp. 577-581
Selective epitaxial growth technology has been extended to the base fo
rmation of a transistor on the basis of the SATURN (Self-Alignment Tec
hnology Utilizing Reserved Nitride) process, a high-speed bipolar LSI
processing technology. The formation of a self-aligned base contact, c
oupled with SIC (Selective Ion-implanted Collector) fabricated by low-
energy ion implantation, has not only narrowed the transistor active r
egions but has drastically reduced the base width. A final base width
of 800 angstrom and a maximum cut-off frequency of 31 GHz were achieve
d.