HIGH-SPEED SUBHALF MICRON SATURN TRANSISTOR USING EPITAXIAL BASE TECHNOLOGY

Citation
H. Fujimaki et al., HIGH-SPEED SUBHALF MICRON SATURN TRANSISTOR USING EPITAXIAL BASE TECHNOLOGY, IEICE transactions on electronics, E76C(4), 1993, pp. 577-581
Citations number
NO
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
09168524
Volume
E76C
Issue
4
Year of publication
1993
Pages
577 - 581
Database
ISI
SICI code
0916-8524(1993)E76C:4<577:HSMSTU>2.0.ZU;2-A
Abstract
Selective epitaxial growth technology has been extended to the base fo rmation of a transistor on the basis of the SATURN (Self-Alignment Tec hnology Utilizing Reserved Nitride) process, a high-speed bipolar LSI processing technology. The formation of a self-aligned base contact, c oupled with SIC (Selective Ion-implanted Collector) fabricated by low- energy ion implantation, has not only narrowed the transistor active r egions but has drastically reduced the base width. A final base width of 800 angstrom and a maximum cut-off frequency of 31 GHz were achieve d.