MULTICHANNEL X-RAY SCINTILLATION SPECTROMETER TO MONITOR MICROPINCH-DISCHARGE PLASMAS

Citation
Vv. Averkiev et al., MULTICHANNEL X-RAY SCINTILLATION SPECTROMETER TO MONITOR MICROPINCH-DISCHARGE PLASMAS, Instruments and experimental techniques, 35(5), 1992, pp. 876-879
Citations number
8
Categorie Soggetti
Instument & Instrumentation",Engineering
ISSN journal
00204412
Volume
35
Issue
5
Year of publication
1992
Part
2
Pages
876 - 879
Database
ISI
SICI code
0020-4412(1992)35:5<876:MXSSTM>2.0.ZU;2-O
Abstract
This article describes a facility to examine the X-ray spectra of micr opinch-discharge plasmas and includes two multichannel X-ray scintilla tion spectrometers. The facility can take measurements for X-rays with energies from 2 to 400 keV and has a dynamic range of 10(11). The X-r ay spectra of the plasma in a z-pinch discharge are measured and analy zed as functions of the discharge current for different electrode mate rials.