PARTIAL LEAST-SQUARES TECHNIQUES IN THE ENERGY-DISPERSIVE X-RAY-FLUORESCENCE DETERMINATION OF SULFUR GRAPHITE MIXTURES

Citation
J. Swerts et al., PARTIAL LEAST-SQUARES TECHNIQUES IN THE ENERGY-DISPERSIVE X-RAY-FLUORESCENCE DETERMINATION OF SULFUR GRAPHITE MIXTURES, Analytical chemistry, 65(9), 1993, pp. 1181-1185
Citations number
23
Categorie Soggetti
Chemistry Analytical
Journal title
ISSN journal
00032700
Volume
65
Issue
9
Year of publication
1993
Pages
1181 - 1185
Database
ISI
SICI code
0003-2700(1993)65:9<1181:PLTITE>2.0.ZU;2-9
Abstract
Energy-dispersive X-ray fluorescence (ED-XRF) was used to determine su lfur in graphite. Because of interferences and abnormal scattering of the excitation radiation (diffraction effects), spectrum evaluation us ing least squares fitting failed. The partial least squares (PLS) meth od on the other hand is able to predict the S concentrations with an a ccuracy better than 5% in the concentration range of 2-60%. The variou s artifacts observed in the spectra can be explained with the PLS mode l.