Polycrystalline CuInSe2 thin films grown by the three-source co-evapor
ation technique are assessed near their fundamental absorption edge wi
th a high resolution photoacoustic spectrometer of the gas-microphone
type. The results are presented for films differing in uniformity, com
position and thickness. The effect of heat treatment in various ambien
ts on the properties of these films have also been investigated using
in addition to photoacoustic spectroscopy, X-ray diffraction, Rutherfo
rd backscattering spectroscopy and scanning electron microscopy.