ANALYSIS OF SOME PROPERTIES OF METAL GLASS MICROEMITTERS SUBJECTED TOSTRONG ELECTRIC-FIELDS

Citation
Ms. Mousa et Db. Hibbert, ANALYSIS OF SOME PROPERTIES OF METAL GLASS MICROEMITTERS SUBJECTED TOSTRONG ELECTRIC-FIELDS, Applied surface science, 67(1-4), 1993, pp. 59-65
Citations number
17
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical
Journal title
ISSN journal
01694332
Volume
67
Issue
1-4
Year of publication
1993
Pages
59 - 65
Database
ISI
SICI code
0169-4332(1993)67:1-4<59:AOSPOM>2.0.ZU;2-1
Abstract
The field electron emission characteristics from metallic substrates t hrough glass tips has been recently published. In this paper we give d etails of the fabrication of these emitters as well as electron emissi on characteristics and current stability. The superior performance of these microemitters to previously described glass cathodes is demonstr ated. A simple theoretical model of the electron emission process is p resented. The hot electron emission process is modelled as occurring t hrough a large Ohmic resistor. Such treatment allows the fitting of em ission current data over a wide range of applied electric field. Compa rison of the theoretical analysis with the typical hot electron emissi on model is discussed.