Wa. Schmidt et al., LOCAL ELECTRIC-FIELDS AT INDIVIDUAL ATOMIC SURFACE SITES - FIELD-ION APPEARANCE ENERGY MEASUREMENTS, Applied surface science, 67(1-4), 1993, pp. 101-110
A new method of determining local electric fields is reported. Under c
onditions of highest field ion image contrast, absolute appearance ene
rgy measurements were carried out at a weakly corrugated step of a Rh(
001) plane and at strongly corrugated step across the atom rows of a R
h(113) facet. Data of local fields, F(loc)hkl, are derived from appear
ance energies. A comparison is made with external electric field stren
gths, F0hkl, determined by electron energy spectroscopy and i-V (Fowle
r-Nordheim) measurements. Significantly different enhancement factors,
F(loc)hkl/F0hkl, were found, 1.27 for steps at the (001) plane, and 1
.54 for steps across the rows of Rh(113). In both cases the step-site
atoms were covered with field-adsorbed Ne. The experimental results ar
e discussed in view of recent self-consistent calculations of local-fi
eld distributions in the proximity of protruding surface atoms. The oc
currence of field ionization of image gas atoms, released from field-a
dsorbed states at step sites by atom-collision processes, is in accord
with the present observations.