The interaction of oxygen with Rh field emitter surfaces has been inve
stigated by means of field ion microscopy (FIM). It has been found tha
t the field-free exposure of 20 L (1 L = 1.3 x 10(-4) Pa . s) oxygen t
o samples at temperatures between 400 and 500 K leads to the reconstru
ction of individual surface planes. In particular, the stepped Rh{110}
and {113} surface planes exhibit ''missing-row'' or (n x 2) and (n x
3) facet structures, whereby n = 1, 2. These structural changes are th
ermally activated and do not occur at temperatures below 400 K. Stable
micrographs with insignificant species desorption during Ne imaging h
ave been obtained after post-dosing 2 L CO to the oxygen-covered surfa
ce at cryogenic temperatures.