TIP EFFECTS AND SURFACE MODIFICATION IN SCANNING-TUNNELING-MICROSCOPY

Authors
TAYLOR ME GOLEN B MCKINNON AW ROSOLEN GC GRAY SM WELLAND ME
Citation
Me. Taylor et al., TIP EFFECTS AND SURFACE MODIFICATION IN SCANNING-TUNNELING-MICROSCOPY, Applied surface science, 67(1-4), 1993, pp. 228-234
Citations number
27
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical
Journal title
Applied surface science → ACNP
ISSN journal
01694332
Volume
67
Issue
1-4
Year of publication
1993
Pages
228 - 234
Database
ISI
SICI code
0169-4332(1993)67:1-4<228:TEASMI>2.0.ZU;2-6
Abstract
In this paper we discuss the effects of tip structure on the behaviour of the scanning tunnelling microscope. The geometry and electronic st ructure of the tip affect both resolution in imaging and current-volta ge spectroscopy. Interactions between tip and sample may lead to modif ication of the sample. Examples of these effects are drawn from a wide range of systems, including reconstructions on semiconductor surfaces , imaging of nanostructures and low-temperature scanning tunnelling mi croscopy.