We present the latest results of our continuing research on atom probe
field ion microscopy on aluminum alloys. The motivation behind the re
search is to understand the effect of trace elements and nanoscale com
positional fluctuations on the development of microstructures in alumi
num alloys produced by different manufacturing processes. The nanoscal
e compositional analyses of Al-Cu-Mg-Ag, Al-Li and AlCeNiFe nanocrysta
lline alloys are presented.