APFIM OBSERVATIONS OF VARIOUS FORMS OF HTSCS

Citation
Aj. Melmed et al., APFIM OBSERVATIONS OF VARIOUS FORMS OF HTSCS, Applied surface science, 67(1-4), 1993, pp. 413-418
Citations number
12
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical
Journal title
ISSN journal
01694332
Volume
67
Issue
1-4
Year of publication
1993
Pages
413 - 418
Database
ISI
SICI code
0169-4332(1993)67:1-4<413:AOOVFO>2.0.ZU;2-4
Abstract
High-temperature superconductor (HTSC) materials are now being prepare d in several different forms, including polycrystalline wafers, single -crystals, bi-crystals, thin films and metal-clad wires and ribbons. A tom probe field ion microscopy (APFIM) investigations may now be perfo rmed with material in each of these starting forms, enabled by the met hod of sharp-pointed shards (MOSS). Initial experiments are described here, including progress in the structural and local compositional cha racterization of thin-film YBCO material.