High-temperature superconductor (HTSC) materials are now being prepare
d in several different forms, including polycrystalline wafers, single
-crystals, bi-crystals, thin films and metal-clad wires and ribbons. A
tom probe field ion microscopy (APFIM) investigations may now be perfo
rmed with material in each of these starting forms, enabled by the met
hod of sharp-pointed shards (MOSS). Initial experiments are described
here, including progress in the structural and local compositional cha
racterization of thin-film YBCO material.