Dw. Heikkinen et al., THE LLNL MULTIUSER TANDEM LABORATORY PIXE MICROPROBE, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 77(1-4), 1993, pp. 45-48
We have recently completed the construction of a new ion beamline prim
arily for particle-induced X-ray emission (PIXE) analysis. This will s
upplement our current ion microtomography (IMT) material characterizat
ion capabilities using accelerator microanalysis. In this paper we des
cribe the PIXE beamline and give some results that characterize the sy
stem. We also report the results of some initial experiments.