QUANTITATIVE PIXE MICROANALYSIS OF THICK SPECIMENS

Authors
CAMPBELL JL HIGUCHI D MAXWELL JA TEESDALE WJ
Citation
Jl. Campbell et al., QUANTITATIVE PIXE MICROANALYSIS OF THICK SPECIMENS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 77(1-4), 1993, pp. 95-109
Citations number
35
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
Journal title
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms → ACNP
ISSN journal
0168583X
Volume
77
Issue
1-4
Year of publication
1993
Pages
95 - 109
Database
ISI
SICI code
0168-583X(1993)77:1-4<95:QPMOTS>2.0.ZU;2-#
Abstract
Methods of standardization in quantitative micro-PIXE analysis are rev iewed and various issues that bear on analytical accuracy are explored ; pertinent recent work on Si(Li) X-ray detector response is included and some geochemical examples are drawn upon. Extension of the GUPIX s oftware to deal with multilayer targets, including secondary fluoresce nce within and between layers, is reported; analytical examples includ e alloy foils and multilayer solar cell structures.