Wj. Teesdale et al., 2-DIMENSIONAL MAPPING OF ELEMENT VARIATION IN MINERALS USING THE GUELPH PROTON MICROPROBE, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 77(1-4), 1993, pp. 405-409
Scanning micro-PIXE is employed in conjunction with backscatter electr
on imaging and cathodoluminescence to study oscillatory zoning of mino
r and trace elements in natural and synthetic minerals. The scanning p
roton microprobe (SPM) is also used to study surface features on indiv
idual mineral grains.