2-DIMENSIONAL MAPPING OF ELEMENT VARIATION IN MINERALS USING THE GUELPH PROTON MICROPROBE

Citation
Wj. Teesdale et al., 2-DIMENSIONAL MAPPING OF ELEMENT VARIATION IN MINERALS USING THE GUELPH PROTON MICROPROBE, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 77(1-4), 1993, pp. 405-409
Citations number
5
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
ISSN journal
0168583X
Volume
77
Issue
1-4
Year of publication
1993
Pages
405 - 409
Database
ISI
SICI code
0168-583X(1993)77:1-4<405:2MOEVI>2.0.ZU;2-X
Abstract
Scanning micro-PIXE is employed in conjunction with backscatter electr on imaging and cathodoluminescence to study oscillatory zoning of mino r and trace elements in natural and synthetic minerals. The scanning p roton microprobe (SPM) is also used to study surface features on indiv idual mineral grains.