STRAIN-MEASUREMENTS IN INXGA1-XAS GAAS STRAINED-LAYER SUPERLATTICES BY PHOTOMODULATED REFLECTANCE

Authors
LEMOS V VAZQUEZLOPEZ C CERDEIRA F
Citation
V. Lemos et al., STRAIN-MEASUREMENTS IN INXGA1-XAS GAAS STRAINED-LAYER SUPERLATTICES BY PHOTOMODULATED REFLECTANCE, Superlattices and microstructures, 13(2), 1993, pp. 189-192
Citations number
13
Categorie Soggetti
Physics, Condensed Matter
Journal title
Superlattices and microstructures → ACNP
ISSN journal
07496036
Volume
13
Issue
2
Year of publication
1993
Pages
189 - 192
Database
ISI
SICI code
0749-6036(1993)13:2<189:SIIGSS>2.0.ZU;2-2