La1-xSrxCoO3 films have been grown highly textured on Si/SiO2(100) and
epitaxially on MgO(100) substrates, despite the large lattice mismatc
h. This is confirmed by XRD pole figures and HR-TEM analyses: misfit c
orrections are observed in the first atomic layers. Electrical and str
uctural analyses are discussed and show that La1-xSrxCoO3 is a promisi
ng electrode material, providing a thermally stable and electrically i
ntimate contact with oxidic active layers. Dielectric and ferro-electr
ic materials sandwiched between these oxidic electrodes showed sharp i
nterfaces and excellent electrical properties.