PULSED-LASER CRYSTALLIZATION AND DOPING FOR THE FABRICATION OF HIGH-QUALITY POLY-SI TFTS

Citation
E. Fogarassy et al., PULSED-LASER CRYSTALLIZATION AND DOPING FOR THE FABRICATION OF HIGH-QUALITY POLY-SI TFTS, Applied surface science, 69(1-4), 1993, pp. 231-241
Citations number
33
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical
Journal title
ISSN journal
01694332
Volume
69
Issue
1-4
Year of publication
1993
Pages
231 - 241
Database
ISI
SICI code
0169-4332(1993)69:1-4<231:PCADFT>2.0.ZU;2-0
Abstract
We review the various applications of pulsed lasers, working in the na nosecond regime, to prepare high-quality poly-Si TFTs. It is shown tha t the best device performances (field-effect mobilities in excess of 1 40 cm2/V - s) are achieved by pulsed excimer laser crystallization of unhydrogenated amorphous Si thin films. In addition, for source and dr ain formation, we demonstrate that the excimer laser induced diffusion of dopant from a solid source (spin-on phosphorus-doped silicate glas s) is very attractive to achieve good electrical properties of the n-c hannel TFTs.