Wz. Tian et al., PARAMETRIC NORMALIZATION FOR FULL-ENERGY PEAK COUNT RATES OBTAINED ATDIFFERENT GEOMETRIES, Journal of radioanalytical and nuclear chemistry, 170(1), 1993, pp. 27-42
The ''Effective Interaction Depth (EID)'' law has been systematically
studied and applied to parametric normalization for peak count rates o
btained at different source-detector distances (S-D). The errors cause
d by EID normalization are less than 4% over the full range of S-D(fro
m infinity to several mm) for true coincidence-free gamma-rays. Parame
tric corrections for the true coincidence (summing) effect are also es
tablished, based on simplified decay schemes and P/T ratio determinati
ons. The total response of Ge detector for single-energy gamma-rays (T
) is clearly defined with scattering contributions from surroundings i
ncluded. Errors from summing effect corrections are also less than 4%.
The combined EID normalization and summing effect corrections give an
error no greater than 5.7% for the worst situations (several mm S-D a
nd cascade-crossover decay scheme), acceptable for most practical K0 N
AA.