TOWARD THE NEXT-GENERATION OF ATOMIC MASS SPECTROMETERS - PLENARY LECTURE

Citation
Gm. Hieftje et al., TOWARD THE NEXT-GENERATION OF ATOMIC MASS SPECTROMETERS - PLENARY LECTURE, Journal of analytical atomic spectrometry, 12(3), 1997, pp. 287-292
Citations number
27
Categorie Soggetti
Spectroscopy
ISSN journal
02679477
Volume
12
Issue
3
Year of publication
1997
Pages
287 - 292
Database
ISI
SICI code
0267-9477(1997)12:3<287:TTNOAM>2.0.ZU;2-V
Abstract
Atomic mass spectrometry, embodied principally as ICP mass spectrometr y (ICP-MS) and glow discharge mass spectrometry (GDMS), has enjoyed ra pid growth during the last decade, yet both methods exhibit shortcomin gs that would be desirable to reduce or eliminate, Prominent among the se shortcomings are drift and limited precision, several troublesome s pectral and matrix interferences, and moderate atom-detection efficien cy. This last limitation is particularly troublesome when ICP-MS, for example, must be interfaced to analytical systems that deliver extreme ly small sample volumes or low flow rates or when extremely limited sa mple sizes must be examined, Such situations are projected to be incre asingly common in the next decade because of the importance of biotech nology and nanostructured materials. Overcoming these limitations will require substantial modifications in both sources and mass-spectromet er designs, Sources will be required that are more efficient at sample utilization, aerosol volatilization and atomization and that provide multidimensional information. Similarly, mass spectrometers of the fut ure must be more atom-efficient, should measure all elements and isoto pes simultaneously, and must operate on a time scale that is compatibl e with microsampling and transient-sampling technology, Possible alter native systems that meet these criteria will be outlined and their lik ely performance assessed. Greatest emphasis is placed on time-of-fligh t mass spectrometry coupled with an ICP source.