Gm. Hieftje et al., TOWARD THE NEXT-GENERATION OF ATOMIC MASS SPECTROMETERS - PLENARY LECTURE, Journal of analytical atomic spectrometry, 12(3), 1997, pp. 287-292
Atomic mass spectrometry, embodied principally as ICP mass spectrometr
y (ICP-MS) and glow discharge mass spectrometry (GDMS), has enjoyed ra
pid growth during the last decade, yet both methods exhibit shortcomin
gs that would be desirable to reduce or eliminate, Prominent among the
se shortcomings are drift and limited precision, several troublesome s
pectral and matrix interferences, and moderate atom-detection efficien
cy. This last limitation is particularly troublesome when ICP-MS, for
example, must be interfaced to analytical systems that deliver extreme
ly small sample volumes or low flow rates or when extremely limited sa
mple sizes must be examined, Such situations are projected to be incre
asingly common in the next decade because of the importance of biotech
nology and nanostructured materials. Overcoming these limitations will
require substantial modifications in both sources and mass-spectromet
er designs, Sources will be required that are more efficient at sample
utilization, aerosol volatilization and atomization and that provide
multidimensional information. Similarly, mass spectrometers of the fut
ure must be more atom-efficient, should measure all elements and isoto
pes simultaneously, and must operate on a time scale that is compatibl
e with microsampling and transient-sampling technology, Possible alter
native systems that meet these criteria will be outlined and their lik
ely performance assessed. Greatest emphasis is placed on time-of-fligh
t mass spectrometry coupled with an ICP source.