Jcs. Kools et al., STRUCTURAL CHARACTERIZATION OF COCU MULTILAYERS GROWN BY LASER ABLATION DEPOSITION, Journal of magnetism and magnetic materials, 121(1-3), 1993, pp. 83-87
Multilayers of 25 x (1.0 nm Cu/1.6 nm Co) have been grown on Si(100) s
ubstrates by the method of laser ablation deposition. A structural cha
racterization of the superlattices has been performed using XRD and TE
M. It is found that multilayers with strong preferential orientation (
(100) on Cu buffer layers and (111) on Fe buffer layers) can be grown.