MAGNETORESISTANCE AND KERR EFFECT INVESTIGATIONS OF CO CU MULTILAYERSWITH WEDGE-SHAPED CU LAYERS/

Citation
R. Mattheis et al., MAGNETORESISTANCE AND KERR EFFECT INVESTIGATIONS OF CO CU MULTILAYERSWITH WEDGE-SHAPED CU LAYERS/, Journal of magnetism and magnetic materials, 121(1-3), 1993, pp. 424-428
Citations number
14
Categorie Soggetti
Material Science","Physics, Condensed Matter
ISSN journal
03048853
Volume
121
Issue
1-3
Year of publication
1993
Pages
424 - 428
Database
ISI
SICI code
0304-8853(1993)121:1-3<424:MAKEIO>2.0.ZU;2-4
Abstract
The magnetic coupling behaviour of dc-magnetron sputtered Co/Cu multil ayers with wedge shaped Cu interlayers was investigated by magnetoresi stance (MR). The well known oscillatory behaviour of both the amplitud e of the MR effect and the saturation field H(s) was found. Within the first region of antiferromagnetic coupling around 1 nm Cu there is a different thickness dependence of H(s) and MR presumably caused due to the imperfect structure of our multilayer System. Domain nucleation a nd reversal behaviour were studied by Kerr microscopy and correlated w ith the observed coupling states determined by MR. There were no clear hints for a biquadratic coupling term.