R. Mattheis et al., MAGNETORESISTANCE AND KERR EFFECT INVESTIGATIONS OF CO CU MULTILAYERSWITH WEDGE-SHAPED CU LAYERS/, Journal of magnetism and magnetic materials, 121(1-3), 1993, pp. 424-428
The magnetic coupling behaviour of dc-magnetron sputtered Co/Cu multil
ayers with wedge shaped Cu interlayers was investigated by magnetoresi
stance (MR). The well known oscillatory behaviour of both the amplitud
e of the MR effect and the saturation field H(s) was found. Within the
first region of antiferromagnetic coupling around 1 nm Cu there is a
different thickness dependence of H(s) and MR presumably caused due to
the imperfect structure of our multilayer System. Domain nucleation a
nd reversal behaviour were studied by Kerr microscopy and correlated w
ith the observed coupling states determined by MR. There were no clear
hints for a biquadratic coupling term.